Single-Event Upsets in Microelectronics
نویسندگان
چکیده
منابع مشابه
Mitigating Single Event Upsets
The Soft Error Rate (SER) is expressed as Failure-in-Time (FIT) units, defined as one soft error occurrence every billion hours of operation.Often SEUmitigation is not required because of the low chance of occurrence. However, for highly complex systems, such as with multiple high-density components, error rate may be a significant system design factor. If your system includes multiple FPGAS an...
متن کاملMitigating Single - Event Upsets
www.xilinx.com 1 © Copyright 2012 Xilinx, Inc. Xilinx, the Xilinx logo, Artix, ISE, Kintex, Spartan, Virtex, Zynq, and other designated brands included herein are trademarks of Xilinx in the United States and other countries. All other trademarks are the property of their respective owners. Occasionally, electronic devices exhibit erroneous behavior for no apparent reason. Through careful exper...
متن کاملMitigating Single-Event Upsets (WP395)
www.xilinx.com 1 © Copyright 2012–2015 Xilinx, Inc. Xilinx, the Xilinx logo, Artix, ISE, Kintex, Spartan, Virtex, Vivado, Zynq, and other designated brands included herein are trademarks of Xilinx in the United States and other countries. All other trademarks are the property of their respective owners. Occasionally, electronic devices exhibit erroneous behavior for no apparent reason. Through ...
متن کاملSingle Event Upsets in Implantable Cardioverter Defibrillators
Single event upsets (SEU) have been observed in implantable cardiac defibrillators. The incidence of SEUs is well modeled by upset rate calculations attributable to the secondary cosmic ray neutron flux. The effect of recent interpretations of the shape of the heavy ion cross-section curve on neutron burst generation rate calculations is discussed. The model correlates well with clinical experi...
متن کاملSystem Effects of Single Event Upsets
At the system level, SEUs in processors are controlled by fault-tolerance techniques such as replication and voting, watchdog processors, and tagged data schemes [13,16,30]. SEUs in memory subsystems are controlled by use of error control codes (ECCs) [4,17,21] and a process called scrubbing. The scrubbing process periodically reads each word in the memory. If the number of faulty digits in a w...
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ژورنال
عنوان ژورنال: MRS Bulletin
سال: 2003
ISSN: 0883-7694,1938-1425
DOI: 10.1557/mrs2003.36